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A NEW X-RAY LINE PROFILE APPROXIMATION USED FOR THE EVALUATION OF THE GLOBAL NANOSTRUCTURE OF NICKEL CLUSTERS

N. Aldea1,* , C. V. Tiusan1, B. Barz1

Affiliation

  1. National Institute for Research and Development of Isotopic and Molecular Technology P.O. Box 700, 3400 Cluj-Napoca, Romania

Abstract

The analysis of the diffraction line broadening in X-ray powder pattern is analytically calculated using the Generalized Fermi Function facilities. X-ray line broadening investigations of supported catalysts have been limited to finding the average crystallite size from the integral width or the full width at half maximum of the diffraction line. In the case of supported metal catalysts, it is generally difficult to perform satisfactory intensity measurements of the higher order (hkl) reflections. Consequently, the classical method of Warren and Averbach cannot be applied. In our cases, only one line is present in the experimental spectra, so we used an approximation method of Charlson that can be applied for small crystallite size. We present a new fitting method based on the Generalized Fermi Function for the approximation and Fourier transform of the experimental X-Ray line profiles..

Keywords

Supported metal catalysts, Crystallite size, X-Ray diffraction, Fourier transform.

Submitted at: Sept. 20, 2003
Accepted at: March 15, 2004

Citation

N. Aldea, C. V. Tiusan, B. Barz, A NEW X-RAY LINE PROFILE APPROXIMATION USED FOR THE EVALUATION OF THE GLOBAL NANOSTRUCTURE OF NICKEL CLUSTERS, Journal of Optoelectronics and Advanced Materials Vol. 6, Iss. 1, pp. 225-235 (2004)