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Amorphous SnSe2 films

F. SAVA1,* , A. LÖRINCZI1, M. POPESCU1, G. SOCOL2, E. AXENTE2, I. N. MIHAILESCU2, M. NISTOR2

Affiliation

  1. National Institute R&D of Materials Physics, 77125 Bucharest-Magurele, 105 bis, Atomistilor str., P. O. Box. MG. 7, Romania
  2. National Institute of Lasers, Plasma and Radiation Physics, 77125-Bucharest-Magurele, P. O. Box MG. 6, Romania

Abstract

Amorphous SnSe2 films were prepared by pulsed laser deposition (PLD) and pulsed electron deposition (PED) from solid polycrystalline targets. The atomic scale structure has been revealed by X-ray diffraction. Hardness properties and electrical properties were measured. The peculiarities of the structures of the films prepared by PLD and PED methods were investigated discussed..

Keywords

SnSe2, amorphous film, Pulsed laser deposition, Pulsed electron deposition, X-ray diffraction.

Submitted at: July 1, 2005
Accepted at: July 20, 2006

Citation

F. SAVA, A. LÖRINCZI, M. POPESCU, G. SOCOL, E. AXENTE, I. N. MIHAILESCU, M. NISTOR, Amorphous SnSe2 films, Journal of Optoelectronics and Advanced Materials Vol. 8, Iss. 4, pp. 1367-1371 (2006)