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CHARACTERISATION OF CARBON NANOTUBE MATERIALS BY RAMAN SPECTROSCOPY AND MICROSCOPY– A CASE STUDY OF MULTIWALLED AND SINGLEWALLED SAMPLES

A. M. Keszler1, L. Nemes1, S. R. Ahmad2,* , X. Fang2

Affiliation

  1. Laboratory for Laser Spectroscopy, Research Centre for Chemistry, Hungarian Academy of Sciences, Pusztaszeri ut 59-67, H-1025 Budapest, Hungary
  2. Centre for Applied Laser Spectroscopy, Swindon, Wiltshire SN6 8LA, UK

Abstract

Laser excited Raman scattering was measured from various carbon nanotube samples, as well as high purity graphite using an Ar+ laser at different wavelengths and the variation of the band parameters was studied as a function of the excitation laser wavelength. Features in the Raman scattering have been identified and assigned to known structural and dynamical sources. Scanning electron microscopic and tunnelling microscopic pictures of two different nanotube samples contributed to the characterization of the samples as multiwalled and singlewalled carbon nanotube bundles and helped identify Raman spectral features..

Keywords

Carbon nanotube, Raman spectroscopy, Scanning electron microscopy, Tunneling microscopy.

Submitted at: Oct. 12, 2004
Accepted at: Dec. 6, 2004

Citation

A. M. Keszler, L. Nemes, S. R. Ahmad, X. Fang, CHARACTERISATION OF CARBON NANOTUBE MATERIALS BY RAMAN SPECTROSCOPY AND MICROSCOPY– A CASE STUDY OF MULTIWALLED AND SINGLEWALLED SAMPLES, Journal of Optoelectronics and Advanced Materials Vol. 6, Iss. 4, pp. 1269-1274 (2004)