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Compositional dependences of optical parameters of Ti1-xZrxO2 thin films

I. P. STUDENYAK1,* , O. T. NAHUSKO1, M. KRANJčEC2,3

Affiliation

  1. Uzhhorod National University, 46 Pidhirna St., Uzhhorod 88000, Ukraine
  2. University of Zagreb, Geotechnical Department Varaždin, 7 Hallerova Aleja, 42000 Varaždin, Croatia
  3. Ruđer Boškovic Institute, 54 Bijenička Cesta, 10000 Zagreb, Croatia

Abstract

Ellipsometric and spectroscopic investigations of Ti1-xZrxO2 thin films were performed. Dispersion dependences of refractive indices and extinction coefficients in the wavelength interval 0.2–0.7 µm were obtained by optical-refractometric synthesis of transmission spectra; optical-refractometric relation was applied to describe the dispersion of the refractive indices. A nonlinear increase of optical pseudogap and a nonlinear decrease of refractive indices with substitution of Ti by Zr was revealed..

Keywords

Amorphous materials, Optical coatings, Ellipsometry, Optical spectroscopy.

Submitted at: June 7, 2006
Accepted at: July 20, 2006

Citation

I. P. STUDENYAK, O. T. NAHUSKO, M. KRANJčEC, Compositional dependences of optical parameters of Ti1-xZrxO2 thin films, Journal of Optoelectronics and Advanced Materials Vol. 8, Iss. 4, pp. 1484-1487 (2006)