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DETERMINATION OF OPTICAL CONSTANTS OF VERY THIN FILMS: AN EXACT ANALYTICAL APPROACH

B. Hristov1,* , P. Gushterova1, P. Sharlandjiev1

Affiliation

  1. Central Laboratory for Optical Storage and Processing of Information, Bulgarian Academy of Sciences, “Acad. G. Bontchev” Str., Bl. 101, Sofia 1113, Bulgaria

Abstract

Inverse optical problems are of major importance for many scientific and engineering projects. To name a few, solutions of nonlinear equations are needed for the determination of optical performance of stable or light sensitive thin films. In this communication we briefly describe an analytical method for finding the roots of a set of nonlinear equations by transformation of the equation system into a multivariant polynomial form. The main advantage of the method is that all possible solutions are found without any initial guess of the unknown parameters. The inverse optical problem of determination of complex refractive index and physical thickness of a thin film from spectrophotometric experimental data is discussed..

Keywords

Inverse optical problems, Optical constants.

Submitted at: April 12, 2005
Accepted at: May 26, 2005

Citation

B. Hristov, P. Gushterova, P. Sharlandjiev, DETERMINATION OF OPTICAL CONSTANTS OF VERY THIN FILMS: AN EXACT ANALYTICAL APPROACH, Journal of Optoelectronics and Advanced Materials Vol. 7, Iss. 3, pp. 1433-1438 (2005)