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Determination of propagation constants in a buried ion exchanged glass optical waveguide by using finite element method

V. A. POPESCU1,* , N. N. PUSCAS1

Affiliation

  1. Physics Department, University "Politehnica "of Bucharest, Splaiul Independentei 313, 060042 Bucharest, Romania

Abstract

The finite element method is used to determine the propagation constants in a buried ion-exchanged glass waveguide when an electric field is applied during the diffusion anneal. For a high applied electric field and short field-assisted annealing time, we have obtained a well confined optical mode and a shift of the electric field intensity peak towards higher values of the depth, which is based on a similar behaviour of the refractive index profile maximum. In the case of the planar waveguide, the depth fundamental mode profile is narrower than those of the channel waveguide. Our equivalent ionic mobility is better in comparison with the ionic mobility based on the Nernst-Einstein equation..

Keywords

Field-assisted annealing, Integrated optics, Ion exchange, Finite element method, Optical waveguides.

Submitted at: May 8, 2006
Accepted at: May 18, 2006

Citation

V. A. POPESCU, N. N. PUSCAS, Determination of propagation constants in a buried ion exchanged glass optical waveguide by using finite element method, Journal of Optoelectronics and Advanced Materials Vol. 8, Iss. 3, pp. 1258-1261 (2006)