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Determination of the refractive-index profile of Ag+ ionexchanged optical waveguides using M-lines spectroscopy

V. A. POPESCU1,* , N. N. PUSCAS1

Affiliation

  1. Department of Physics, University "Politehnica" of Bucharest, Splaiul Independentei 313, 060042 Bucharest, Romania

Abstract

In an optical waveguide for the same parameters of the refractive index, the number of the modes is smaller and the normalized fundamental electric field is localized on a smaller depth and therefore producing a better mode confinement (smaller mode profile dimensions) for complementary error function in comparison with the Gaussian or exponential profile. Also, the number of the modes, the waveguide depth and the value of the maximum refractive index reached close to the waveguide-air interface are increased with the diffusion time, the temperature and the concentration of the AgNO3 in NaNO3 for some planar optical waveguides obtained by Ag+ ion-exchange in soda lime glass which are investigated by using m-lines spectroscopy..

Keywords

Waveguides, Quantum mechanics, M-lines spectroscopy, Ag+ ion-exchange.

Submitted at: June 13, 2007
Accepted at: Sept. 18, 2007

Citation

V. A. POPESCU, N. N. PUSCAS, Determination of the refractive-index profile of Ag+ ionexchanged optical waveguides using M-lines spectroscopy, Journal of Optoelectronics and Advanced Materials Vol. 9, Iss. 9, pp. 2833-2837 (2007)