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DISORDER IN GexAs40-xS60 GLASSES AND FILMS: AN EXAFS STUDY

E. Skordeva1,* , M. Womes2, P. E. Lippens2, J. C. Jumas2, D. Arsova1

Affiliation

  1. Institute of Solid State Physics, Bulgarian Academy of Sciences, 72 Tzarigradsko Chaussee Blvd., 1784 Sofia, Bulgaria
  2. LAMMI CNRS UMR5072, Université Montpellier II, Place E. Bataillon, CC015, F-34095 Montpellier Cedex 5, France

Abstract

X-ray absorption spectroscopy has been used to study GexAs40-xS60 glasses and films at the K edges of As, Ge and S. The spectra obtained for glasses with different compositions as well as those for glasses and films are compared. The spectra of films before and after illumination or thermal treatments are compared in order to study the effect of annealing and/or illumination upon the disorder. The results are discussed in terms of the degree of chemical and structural disorders of the amorphous matrices..

Keywords

EXAFS, XANES, Amorphous Ge-As-S, Thin films.

Submitted at: July 4, 2005
Accepted at: July 21, 2005

Citation

E. Skordeva, M. Womes, P. E. Lippens, J. C. Jumas, D. Arsova, DISORDER IN GexAs40-xS60 GLASSES AND FILMS: AN EXAFS STUDY, Journal of Optoelectronics and Advanced Materials Vol. 7, Iss. 4, pp. 1869-1874 (2005)