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Effect of copper thiourea complex on the performance of KDP single crystals

P. KUMARESAN1,2, S. MOORTHY BABU1,* , P. M. ANBARASAN3

Affiliation

  1. Crystal Growth Centre, Anna University, Chennai-600 025, India
  2. Department of Physics, Adhiparasakthi Engineering College, Melmaruvathur-603 319, India
  3. Department of Physics, Periyar University, Salem, India

Abstract

A new semi-organic nonlinear optical (NLO) material metal thiourea complex doped KDP was grown in large size measuring 19 × 5 × 3 mm3 by slow solvent evaporation technique for the first time. Optical quality KDP (KH2PO4) crystals can be grown by solution growth methods by conventional as well as fast growth techniques. Solution growth technique is followed for KDP and doped Copper Thiourea complex. KDP is an efficient angle tuned dielectric medium for optical harmonic generation in and near the visible region. Improvement in the quality of the KDP crystals and the performance of the KDP based devices can be realized with suitable dopants. The cell parameter values were determined by single crystal X-ray diffraction studies. Fourier Transform Infrared spectroscopic analysis was carried out on the grown sample to ascertain the fundamental functional groups. The thermal behavior of the grown copper thiourea complex doped KDP sample was analyzed by TG & DTA analysis. The mechanical properties of the grown crystals have been studied using Vickers microhardness tester. The optical transmission studies and second harmonic generation (SHG) efficiency studies justified the device quality of the grown crystal and the SHG study reveals that the grown sample has nearly 1.2 times higher efficiency than the potassium dihydrogen phosphate (KDP), a well known NLO material..

Keywords

Growth from solution, Non-linear materials, Characterization.

Submitted at: May 29, 2007
Accepted at: Sept. 18, 2007

Citation

P. KUMARESAN, S. MOORTHY BABU, P. M. ANBARASAN, Effect of copper thiourea complex on the performance of KDP single crystals, Journal of Optoelectronics and Advanced Materials Vol. 9, Iss. 9, pp. 2787-2791 (2007)