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FAR INFRARED CHARACTERIZATION OF SAMARIUM DOPED SINGLE CRYSTAL PbTe

P. M. Nikolic1,* , W. König2, D. Lukovic1, S. Savic1, S. Vujatovic1, K. Radulovic3, V. Blagojevic4

Affiliation

  1. Institute of Technical Sciences SASA, P.O. Box 315, 11000 Belgrade, Serbia
  2. Max Planck Institut für Festkörperforschung, Heisenbergstrasse 1, 7000 Stuttgart 80, Germany
  3. IHTM - Institute of Microelectronic Technologies and Single Crystals, Njegoseva 12, 11000 Belgrade, Serbia
  4. Faculty of Electrical Engineering, Bulevar kralja Aleksandra 73, 11000 Belgrade, Serbia

Abstract

Single crystal samples of lead telluride doped with samarium were produced using the Bridgman method. Far infrared reflectivity spectra in the temperature range 10 K - 300 K are presented and numerically analyzed using a fitting procedure based on a modified plasmon phonon interaction model. The optical parameters were determined and three local modes of samarium were observed at about 167 cm-1, 227 cm-1 and 486 cm-1..

Keywords

Rear-earth element, Far-infrared reflectivity, Plasmon-phonon interaction.

Submitted at: June 7, 2004
Accepted at: June 22, 2004

Citation

P. M. Nikolic, W. König, D. Lukovic, S. Savic, S. Vujatovic, K. Radulovic, V. Blagojevic, FAR INFRARED CHARACTERIZATION OF SAMARIUM DOPED SINGLE CRYSTAL PbTe, Journal of Optoelectronics and Advanced Materials Vol. 6, Iss. 3, pp. 811-816 (2004)