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HIGH PRECISION CRYSTAL ORIENTATION MEASUREMENTS WITH THE X-RAY OMEGA-SCAN - A TOOL FOR THE INDUSTRIAL USE OF QUARTZ AND OTHER CRYSTALS

G. Hildebrandt1,2, H. Bradaczek2,*

Affiliation

  1. Formerly Fritz-Haber-Institut der Max-Planck-Gesellschaft, Berlin-Dahlem, Germany
  2. Research Center of EFG INTERNATIONAL, Dueppelstr. 13, D-14163 Berlin, Germany

Abstract

The X-ray Omega-Scan method has been developed in order to get the single crystal orientation with very high precision (± 0.0010). It is shown how this method helped to improve the quartz oscillator production all around the world. The application of the Omega – Scan method for other crystals as e.g. sapphire and silicon carbide, is described. It has been firmly established that the method is suitable for arbitrary single crystals with arbitrary lattice geometry and symmetry..

Keywords

X-ray, Omega-Scan, Single crystal, Quartz, Sapphire, Silicon carbide.

Submitted at: Dec. 18, 2003
Accepted at: March 15, 2004

Citation

G. Hildebrandt, H. Bradaczek, HIGH PRECISION CRYSTAL ORIENTATION MEASUREMENTS WITH THE X-RAY OMEGA-SCAN - A TOOL FOR THE INDUSTRIAL USE OF QUARTZ AND OTHER CRYSTALS, Journal of Optoelectronics and Advanced Materials Vol. 6, Iss. 1, pp. 5-21 (2004)