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HOLOGRAPHIC INTERFEROMETRY USING PHOTOREFRACTIVE CRYSTALS FOR MASS TRANSFER PROCESSES INVESTIGATION

A. Petris1, M. Levai2,* , A. Stoica3, V. I. Vlad1

Affiliation

  1. Institute of Atomic Physics, NILPRP – Dept. of Lasers, ROCEP, Bucharest, Romania
  2. Technical University of Civil Engineering of Bucharest, Dept. of Physics, Bucharest, Romania
  3. University “Politehnica”, Dept. of Chemical Engineering, Bucharest, Romania

Abstract

This paper extends the applications of holographic interferometry by four wave mixing using photorefractive crystals to the study of mass transfer processes such as interfacial turbulence (Marangoni effect) and adsorption. The recording material, a Bi12TiO20 crystal, has good sensitivity and diffraction efficiency at the wavelength of the laser diode used as light source, even without external electric field applied on the crystal, unlimited reusability and allows the control of the writing and storage times. Interfacial instabilities produced by Marangoni convection driven by surface tension gradient can intensify the efficiency of various separation processes but are far from being understood completely, so the experimental studies are very important in order to predict a stability criterion. We have studied some liquid – liquid systems characterised by an intense interfacial turbulence induced by the acetic acid. In order to characterise the adsorbent properties of adsorbent materials, it is necessary to determine the concentration profile in the vicinity of the adsorbent. We studied phenol adsorption on granular activated coal and powder activated coal. The visualisation of the diffusion layer and measurements of its dynamics have been performed..

Keywords

Holographic interferometry, Photorefractive crystals, Mass transfer phenomena, Interfacial turbulence, Adsorption.

Submitted at: March 12, 2004
Accepted at: June 10, 2004

Citation

A. Petris, M. Levai, A. Stoica, V. I. Vlad, HOLOGRAPHIC INTERFEROMETRY USING PHOTOREFRACTIVE CRYSTALS FOR MASS TRANSFER PROCESSES INVESTIGATION, Journal of Optoelectronics and Advanced Materials Vol. 6, Iss. 2, pp. 385-392 (2004)