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IMMERSION HOLOGRAPHIC RECORDING OF SUBWAVELENGTH GRATINGS IN AMORPHOUS CHALCOGENIDE THIN FILMS

J. Teteris1,* , M. Reinfelde1

Affiliation

  1. Institute of Solid State Physics, University of Latvia, LV-1063, Riga, Latvia

Abstract

A solid immersion holographic method for the recording of refractive-index and surface relief modulated gratings with a period of 0.2 mm – 1 mm in amorphous films of chalcogenide semiconductors As2S3 and As-S-Se has been developed and studied. The angular selectivity of holographic recording in amorphous chalcogenide thin films can be improved significantly by a decrease of grating period. The possibility to use the amorphous chalcogenide films as a media for holographic recording and storage of information with high density is discussed..

Keywords

Holography, Lithography, Amorphous As-S-Se and As2S3 films.

Submitted at: Aug. 24, 2005
Accepted at: Sept. 22, 2005

Citation

J. Teteris, M. Reinfelde, IMMERSION HOLOGRAPHIC RECORDING OF SUBWAVELENGTH GRATINGS IN AMORPHOUS CHALCOGENIDE THIN FILMS, Journal of Optoelectronics and Advanced Materials Vol. 7, Iss. 5, pp. 2581-2586 (2005)