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NANOSTRUCTURAL VOIDS IN GLASSY-LIKE As2Se3 STUDIED WITH FSDP-RELATED XRD AND PALS TECHNIQUES

T. S. Kavetskyy1,2, O. I. Shpotyuk2,3,*

Affiliation

  1. Solid-State Microelectronics Laboratory, Drohobych Ivan Franko State Pedagogical University, 24, Franko str., Drohobych, 82100, Ukraine
  2. Institute of Materials, Scientific Research Company “Carat”, 202, Stryjska str., Lviv, 79031, Ukraine
  3. Institute of Physics, Jan Dlugosz University of Czestochowa, 13/15, al. Armii Krajowej, Czestochowa, 42201, Poland

Abstract

Nanostructural voids in glassy-like As2Se3 have been studied using X-ray diffraction in respect to the first sharp diffraction peak (FSDP-related XRD) within well-known Elliott’s void-based model for the origin of the FSDP and positron annihilation lifetime spectroscopy (PALS). A good agreement between experimental data and theoretical ones obtained within Popescu’s model for nanovoid distribution in glass structural network has been observed. The empirical relationship between the position of the FSDP and diameter of nanovoids has been established for the investigated layer-like type chalcogenide glass for the first time. The perspectives in using of FSDP-related XRD along with PALS for research of nanoscale void-species structure in network chalcogenide glasses have been demonstrated..

Keywords

Chalcogenide glasses, Positron annihilation, X-ray diffraction, First sharp diffraction peak.

Submitted at: Aug. 24, 2005
Accepted at: Sept. 22, 2005

Citation

T. S. Kavetskyy, O. I. Shpotyuk, NANOSTRUCTURAL VOIDS IN GLASSY-LIKE As2Se3 STUDIED WITH FSDP-RELATED XRD AND PALS TECHNIQUES, Journal of Optoelectronics and Advanced Materials Vol. 7, Iss. 5, pp. 2267-2273 (2005)