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OBSERVATION OF MEYER-NELDEL RULE IN a- Se60Te20Ge20 THIN FILMS IN PRESENCE OF LIGHT

D. Kumar1,* , S. Kumar1

Affiliation

  1. Department of Physics, Christ Church College, Kanpur - 208 001, India

Abstract

In general, in case of semiconductors, conductivity (s) varies exponentially with temperature (T), i.e., s = s0 exp [-DE/k T]. In most of the materials, s0 does not depend on DE. However, in many amorphous and liquid semiconductors and many other class of materials, s0 is found to increase exponentially with DE. This is called Meyer- Neldel rule. This rule is generally verified by selecting different compositions of different DE in a given class of materials. This opens a possibility of change in various other physical properties apart from DE. In the present paper, we report on the observation of Meyer- Neldel rule where DE is varied by varying the intensity of light while measuring the photoconductivity in amorphous thin films of Se60Te20Ge20 instead of changing composition of the glassy system. The observation of Meyer-Neldel rule in the present case indicates that this rule is more general and does not cause due to change in density or distribution of defect states or any other physical property due to change in composition..

Keywords

Meyer-Neldel rule, Amorphous thin films, Chalcogenide glasses.

Submitted at: June 14, 2004
Accepted at: June 22, 2004

Citation

D. Kumar, S. Kumar, OBSERVATION OF MEYER-NELDEL RULE IN a- Se60Te20Ge20 THIN FILMS IN PRESENCE OF LIGHT, Journal of Optoelectronics and Advanced Materials Vol. 6, Iss. 3, pp. 777-780 (2004)