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ON THE OPTICAL PROPERTIES OF POLYCRYSTALLINE CdSe THIN FILMS

C. Baban1,* , G. I. Rusu1, P. Prepelita1

Affiliation

  1. Faculty of Physics, “Al. I. Cuza” University, Carol I Blvd, Iasi, R-700506, 11, Romania

Abstract

In this paper optical properties of CdSe thin films deposited by thermal evaporation under vacuum onto glass substrates are presented. The structural investigations performed by means of XRD technique showed that the films have a polycrystalline and hexagonal (würtzite) structure. The values of some important parameters of the studied films (absorption coefficient, optical bandgap energy and refractive index) are determined from transmission spectra. The values of the optical bandgap energy, Eg, calculated from the absorption spectra, ranged between 1.65 and 1.75 eV. The dispersion of the refractive index was explained using a single oscillator model..

Keywords

CdSe, polycrystalline thin films, Optical properties, Refractive index.

Submitted at: Aug. 18, 2004
Accepted at: March 23, 2005

Citation

C. Baban, G. I. Rusu, P. Prepelita, ON THE OPTICAL PROPERTIES OF POLYCRYSTALLINE CdSe THIN FILMS, Journal of Optoelectronics and Advanced Materials Vol. 7, Iss. 2, pp. 817-821 (2005)