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On the structural and optical characteristics of zinc telluride thin films

G. I. RUSU1,* , P. PREPELIŢĂ1, R. S. RUSU1, N. APETROAIE1, G. ONICIUC1, A. AMARIEI1

Affiliation

  1. Faculty of Physics, “Al. I. Cuza” University, 11 Carol I Blvd., R-700506, Romania

Abstract

Zinc telluride (ZnTe) thin films were prepared by vacuum evaporation of polycrystalline ZnTe onto glass substrates at 300 450K. The films were characterized by X-ray diffraction (XRD) and atomic force microscopy (AFM).The crystalline structure was found to be cubic (zinc blende). The film crystallites are preferentially oriented with (111) planes parallel to the substrates XRD patterns and AFM images have been used to determine the microstructural parameters (crystallite size, lattice parameter) of investigated films.The optical bandgap (Eg=1.95 eV-2.40 eV) determined from absorption spectra indicates direct band-to-band transitions. The effect of the deposition conditions and post-deposition heat treatment on the structural and optical properties has been studied..

Keywords

Zinc telluride, Thin films, Microstructural parameters, Absorption spectra.

Submitted at: March 15, 2006
Accepted at: May 18, 2006

Citation

G. I. RUSU, P. PREPELIŢĂ, R. S. RUSU, N. APETROAIE, G. ONICIUC, A. AMARIEI, On the structural and optical characteristics of zinc telluride thin films, Journal of Optoelectronics and Advanced Materials Vol. 8, Iss. 3, pp. 922-926 (2006)