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OPTICAL BEHAVIOR OF MULTILAYERED CdTe/Cu THIN FILMS DEPOSITED BY STACKED LAYER METHOD

G. G. Rusu1,* , M. Rusu1

Affiliation

  1. Faculty of Physics, Al. I. Cuza University, Iasi, Romania

Abstract

In this paper the experimental results concerning the absorption and photoluminescence spectra in the wavelength range 650 – 1100 nm for CdTe/Cu multilayered thin films are presented. Films with thickness about 900 nm were evaporated under vacuum onto unheated optical glass substrates using the stacked layer method. During deposition process, the substrates holder periodically passed in front of two separately evaporation sources for CdTe and Cu, having the temperatures of 925 K and 1200 K respectively. The XRD structural analysis revealed a cubic CdTe structure, with crystallites preferentially oriented with (111) plane parallel to the substrate, without additional peaks for Cu or Te structures. The energy gap value of 1.48 eV, deduced from absorption spectra, is in good agreement with those for bulk CdTe crystal. The obtained results indicate that this deposition technique may reduce the Te excess and improve the structure and optical properties of CdTe thin films for optoelectronic devices technology..

Keywords

CdTe films, Layered structures, Optical properties.

Submitted at: Feb. 23, 2005
Accepted at: March 23, 2005

Citation

G. G. Rusu, M. Rusu, OPTICAL BEHAVIOR OF MULTILAYERED CdTe/Cu THIN FILMS DEPOSITED BY STACKED LAYER METHOD, Journal of Optoelectronics and Advanced Materials Vol. 7, Iss. 2, pp. 885-889 (2005)