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Physical characterization of CdMnS nanocrystalline thin films grown by vacuum thermal evaporation

F. IACOMI1,* , I. SALAORU1, N. APETROAEI1, A. VASILE2, C. M. TEODORESCU3, D. MACOVEI3

Affiliation

  1. Al. I. Cuza University, Faculty of Physics, 11 Carol I Blvd., 700506, Iasi, Romania
  2. Al. I. Cuza University, Faculty of Chemistry, 11 Carol I Blvd., 700506, Iasi, Romania
  3. National Institute of Material Physics, P.O. Box MG 7, 77125-Magurele Bucharest, Romania

Abstract

CdMnS ternary aloys have attracted much attention because they permit to tune the energy gap, the effective mass and the lattice constant by varying the concentration of the magnetic material. Growth and physical characterization of Cd1-xMnxS thin films, prepared in different conditions on glass and silicon substrates by thermal evaporation technique is presented. The starting powders, CdS and Mn, were mixed in a crucible in various molar ratios. The samples were characterized by XRD, AFM and XPS. The blue shift of band gap of thin films might be ascribed to the size effect of the smal grains and to the fact that Cd was substituted by Mn in the CdS structure..

Keywords

Diluted magnetic semiconductors, Thin films, Quasi-closed volume technique, Structure, Optical properties.

Submitted at: Dec. 20, 2005
Accepted at: Jan. 26, 2006

Citation

F. IACOMI, I. SALAORU, N. APETROAEI, A. VASILE, C. M. TEODORESCU, D. MACOVEI, Physical characterization of CdMnS nanocrystalline thin films grown by vacuum thermal evaporation, Journal of Optoelectronics and Advanced Materials Vol. 8, Iss. 1, pp. 266-270 (2006)