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Preparation and structural characterization of thin-film CdTe/CdS heterojunctions

I. SALAORU1, P. A. BUFFAT2, D. LAUB3, A. AMARIEI1, N. APETROAEI1, M. RUSU1,*

Affiliation

  1. “Al.I. Cuza” University, 11 Carol I Bd., 700506 Iasi, Romania
  2. Centre Interdisciplinaire de Microscopie Electronique (CIME), EPFL, Lausanne, Suisse
  3. bCentre Interdisciplinaire de Microscopie Electronique (CIME), EPFL, Lausanne, Suisse

Abstract

The structural characteristics of CdTe/CdS thin-film heterojunctions are investigated. The studied heterojunctions were obtained by successive thermal evaporation under vacuum onto unheated SnO2 coated glass substrates of CdS and CdTe films, respectively. The morphological and structural studies of the above mentioned heterojunction component films, in comparison with those of CdS and CdTe films, deposited separately, onto glass substrates, were carried out using transmission electron microscopy, X-ray diffraction and atomic force microscopy techniques..

Keywords

CdTe, CdS, Thin films, Heterojunctions, Structural properties.

Submitted at: March 15, 2006
Accepted at: May 18, 2006

Citation

I. SALAORU, P. A. BUFFAT, D. LAUB, A. AMARIEI, N. APETROAEI, M. RUSU, Preparation and structural characterization of thin-film CdTe/CdS heterojunctions, Journal of Optoelectronics and Advanced Materials Vol. 8, Iss. 3, pp. 936-940 (2006)