C. M. Teodorescu^1,* , D. Macovei¹, A. Lungu¹

Abstract

Nanostructured Ni/C60 thin films, produced by co-evaporation of Ni and fullerene, have been investigated by both X-ray diffraction (XRD) and X-ray magnetic circular dichroism (XMCD). X-ray diffraction has shown the co-existence of diffraction specific peaks for the fullerene face-centered cubic crystal structure and diffraction peaks of Ni nanoparticles in the face-centered cubic structure, which are broadened by nanoparticule finite dimensions. Analysis of peak widths shows that the Ni nanocrystallite size ranges from 4.7 to 19.2 nm. The XMCD signals for a sample series, preparated on relatively low-temperature substrates during the co-evaporation, can be interpreted as having distinct contributions due to both bulk and surface Ni atoms. These two kind of atoms are antiferromagnetic coupled. The Ni atoms which are at the interface with the fullerite matrix show an enhanced orbital magnetic moment, while the orbital magnetic moment of Ni atoms in the bulk has very low values, as it can be expected for a crystalline field with a cubic symmetry..

Keywords

Nanostructured Ni/C60, X-ray diffraction, X-ray magnetic circular dichroism.

Submitted at: Sept. 3, 2004
Accepted at: Dec. 6, 2004

Citation

C. M. Teodorescu, D. Macovei, A. Lungu, STRUCTURAL AND MAGNETIC INVESTIGATIONS OF NICKEL CLUSTERS IN C60 MATRICES, Journal of Optoelectronics and Advanced Materials Vol. 6, Iss. 4, pp. 1275-1285 (2004)

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