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Structural and microstructural properties of porous PZT films

V. STANCU1,* , I. BOERASU2, M. LISCA1, L. PINTILIE3, M. POPESCU1, F. SAVA1

Affiliation

  1. National Institute of Materials Physics Bucharest-Magurele, P. O. Box MG-7, 77125, Romania
  2. Josef Stefan Institute, Jamova 39, 1000 Ljubljana, Slovenia
  3. Max Planck Institute of Microstructure Physics, Weinberg 2, Halle, 06129 Germany

Abstract

PbZr1-xTixO3 (PZT) film was prepared by addition of polymer polyvinylpirrolidone (PVP) in the PZT precursor and hydrolysis of the PZT precursor sol. Porous thin films were prepared by spin coating on Pt-coated Si substrate. The structure of the films was investigated by X-ray diffraction (XRD). (100)-oriented PZT 20/80 film was obtained by hydrolysis of sol. PVP addition leads to the (110)-orientation of the film. The surface microstructure of the films was characterised with Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM). The surface profile indicates a films roughness of 5 nm. No micro-cracks were observed on film surface. The average remnant polarization and the coercive field were obtained from the hysteresis loop measurements. The ferroelectric behavior has been evidenced by the presence of the butterfly shape of the capacitance-voltage characteristics. Experimental results show that the dielectric constant of the PZT porous film is lower than that of the dense film..

Keywords

Porous PZT fims, Polyvinylpirrolidone (PVP), Hydrolysis.

Submitted at: June 8, 2006
Accepted at: July 20, 2006

Citation

V. STANCU, I. BOERASU, M. LISCA, L. PINTILIE, M. POPESCU, F. SAVA, Structural and microstructural properties of porous PZT films, Journal of Optoelectronics and Advanced Materials Vol. 8, Iss. 4, pp. 1492-1497 (2006)