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Structural and optical properties of zinc oxide thin films prepared by spray pyrolysis method

C. GÜMÜS1, O. M. OZKENDIR1, H. KAVAK1, Y. UFUKTEPE1,*

Affiliation

  1. Cukurova Univ. Fac. Sci.& Letters, Dept. Physics, Adana, 01330 Turkey

Abstract

Polycrysta line ZnO thin films were deposited on a glass substrate by a spray pyrolysis technique using solution of zinc acetate and air as the carrier gas at 400 °C temperature. Optical constants such as refractive index n and extinction coefficient k, were determined from transmittance spectrum in the ultraviolet-visible-near infrared (UV-VIS-NIR) regions using envelope methods. The films were found to exhibit high transmittance (>90 %), low absorbance and low reflectance in the visible regions. Absorption coefficient α, and the thickness of the film t were calculated from interference of transmittance spectra. The energy band gap, and the thickness of the films were evaluated as 3.27 eV and 0.31-0.52 µm respectively. The crystalographic structure of these films was analyzed with x-ray diffractometer. The films were polycrysta line in nature with preferred (002) orientation perpendicular to substrate surface and the grain size estimated to be 40 nm. The extended x-ray absorption fine structure (EXAFS) calculations above the K-edge of Zn in the ZnO thin film have been performed by using real-space multiple scattering of photoelectrons. For ZnO thin films, the values of the correlated mean square relative displacements of nearest-neighbor atoms derived from EXAFS spectra show good agreement with those measured from the x-ray diffraction experiments..

Keywords

ZnO, Optical properties, Thin films, Spray pyrolysis, EXAFS.

Submitted at: Dec. 8, 2005
Accepted at: Jan. 26, 2006

Citation

C. GÜMÜS, O. M. OZKENDIR, H. KAVAK, Y. UFUKTEPE, Structural and optical properties of zinc oxide thin films prepared by spray pyrolysis method, Journal of Optoelectronics and Advanced Materials Vol. 8, Iss. 1, pp. 299-303 (2006)