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Structural, optical and electrical properties of Sb2O3 thin films with different thickness

N. TIGAU1,* , V. CIUPINA2, G. PRODAN2

Affiliation

  1. Faculty of Science, “Dunarea de Jos” University, Galati, R-800201, Romania
  2. "Ovidius” University, Constanta, R-900527, Romania

Abstract

Thin films of Sb2O3 with different thickness (d=0.20-1.10 µm) were deposited onto glass substrates by thermal evaporation technique. The structural, optical and electrical properties were investigated and the effect of films thickness on films properties was discussed. The transmission electron microscopy (TEM) analysis revealed that the Sb2O3 thin films are polycrysta line and have a cubic structure. The smal values of the roughness obtained from atomic force microscopy (AFM) measurements, ranging from 4.7 to 17.6 nm, show relatively smooth surfaces. The spectral absorption coefficient and optical band gap energy of the Sb2O3 thin films at the fundamental absorption region were determined using the spectral data of transmittance measurements in the wavelength range 250-1400 nm. Temperature dependence of the electrical conductivity was studied in a wide range, 289-445 K. It is observed that the electrical conductivity of Sb2O3 thin films tend to increase with increasing of the film thickness. Also, it is observed that the surface defects in thinner films cold play a more important role in the effect on optical and electrical properties. For thicker films the grain boundary could play a more important role in the effect on films properties..

Keywords

Antimony trioxide, Thin films, Optical band gap, Electrical conductivity.

Submitted at: Oct. 14, 2005
Accepted at: Jan. 26, 2006

Citation

N. TIGAU, V. CIUPINA, G. PRODAN, Structural, optical and electrical properties of Sb2O3 thin films with different thickness, Journal of Optoelectronics and Advanced Materials Vol. 8, Iss. 1, pp. 37-42 (2006)