"

Cookies ussage consent

Our site saves small pieces of text information (cookies) on your device in order to deliver better content and for statistical purposes. You can disable the usage of cookies by changing the settings of your browser. By browsing our site without changing the browser settings you grant us permission to store that information on your device.

I agree, do not show this message again.

Structure of PZT thin films deposited on stainless steel and on platinum/silicon substrate

V. STANCU1, F. SAVA1, M. LISCA1, L. PINTILIE2,* , M. POPESCU1

Affiliation

  1. National Institute of Materials Physics Bucharest-Magurele, P. O. Box MG-7, 77125, Romania
  2. Max Planck Institute of Microstructure Physics, Weinberg 2, Halle, 06129 Germany

Abstract

Pb(Zr1-xTix)O3 (PZT) thin films were prepared by sol-gel method on stainless steel (SS) and on platinum-coated silicon substrate (Pt/Si). The structure revealed by X-ray diffraction shows strong crystallographic orientation: (110) and (100), respectively. A small amount of pyrochlore phases (Pb2(Zr,Ti)2O6-δ is formed in the films deposited on SS substrate. The crystallite size shows significant differences: ( ) (00 ) SS l d = 27.1 nm, ( ) ( 00) Pt h d = 88 nm. The tetragonal splitting is (Δc/c)(SS)=3.55 % and (Δc/c)(Pt)=3.32 %..

Keywords

PZT, Stainless steel substrate, Platinum substrate, Ferroelectric, X-ray diffraction, Hysteresis cycle.

Submitted at: Sept. 10, 2007
Accepted at: Sept. 18, 2007

Citation

V. STANCU, F. SAVA, M. LISCA, L. PINTILIE, M. POPESCU, Structure of PZT thin films deposited on stainless steel and on platinum/silicon substrate, Journal of Optoelectronics and Advanced Materials Vol. 9, Iss. 9, pp. 2967-2969 (2007)