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TEMPERATURE DEPENDENT CHANGE OF THE MnS K-EDGE

O. M. Özkendir1, Y. Ufuktepe1,*

Affiliation

  1. Physics Department, University of Cukurova, 01330 Adana-Turkey

Abstract

The x-ray absorption near-edge structure (XANES) of Mn K-edge in MnS have been investigated. The full multiple scattering approach has been applied to the calculation of Mn K edge XANES spectra of MnS. The calculations are based on different choices of one electron potentials according to Manganese coordinations by using the real space multiple scattering method FEFF 8 code. The crystallographic and electronic structure of the MnS are tested at various temperature ranges from 300 to 573 K. We have found prominent changes in the XANES spectra of MnS by the change of the temperature. Such observed changes are explained by considering the structural, electronic and spectroscopic properties. The results are consistent with experimental spectra..

Keywords

MnS Thin Film, Electronic Properties, Chalcogenide, XANES.

Submitted at: July 4, 2005
Accepted at: Sept. 22, 2005

Citation

O. M. Özkendir, Y. Ufuktepe, TEMPERATURE DEPENDENT CHANGE OF THE MnS K-EDGE, Journal of Optoelectronics and Advanced Materials Vol. 7, Iss. 5, pp. 2655-2660 (2005)