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VERY THIN aaaa - As –S FILMS: OPTICAL CONSTANTS AND PHOTOINDUCED RESPONSE IN VIS AND NIR

P. Gushterova1,* , P. Sharlandjiev1

Affiliation

  1. Central Laboratory for Optical Storage and Processing of Information, Bulgarian Academy of Sciences, “Acad. G. Bonchev” Str., Bl. 101, Sofia 1113, Bulgaria

Abstract

Very thin chalcogenide films are extensively studied for the needs of emerging nanotechnologies. Presently, the knowledge of the structure of these films and their photoresponse is of theoretical interest and also of practical importance for many applications. Optical methods for thin film characterization have advantages that they are nondestructive, fast and effective. Here we report an application of recently developed spectrophotometric method for optical constants (refractive index, n, extinction coefficient, k) and physical thickness (d) determination to amorphous As-S films with d between 10 and 30 nm. Information on photoinduced changes in the films is obtained as well..

Keywords

Thin chalcogenide films, Optical constants, Photoinduced changes.

Submitted at: April 12, 2005
Accepted at: May 26, 2005

Citation

P. Gushterova, P. Sharlandjiev, VERY THIN aaaa - As –S FILMS: OPTICAL CONSTANTS AND PHOTOINDUCED RESPONSE IN VIS AND NIR, Journal of Optoelectronics and Advanced Materials Vol. 7, Iss. 3, pp. 1305-1310 (2005)