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Addition of Li-based salts into superconducting Bi1.8Pb0.4Sr1.8Ba0.2Ca2Cu3Ox ceramic

V. MIHALACHE1,* , GHE.-V. ALDICA1, P. BADICA1

Affiliation

  1. National Institute of Materials Physics, Bucharest-Magurele, str. Atomistilor 105 bis, POB MG-7, 077125 Romania

Abstract

Li-based salts M such as LiF, LiCl and LiI were introduced into Bi1.8Pb0.4Sr1.8Ba0.2Ca2Cu3Ox superconducting ceramic. Samples were prepared by solid state reaction route using a precursor, (Sr, Ba)CaCuOz, and were characterized by ac susceptibility, resistivity and structural measurements. Imaginary part of the magnetic susceptibility allows observation of two different Bi2223 superconducting phases with different intragranular properties. Two intragranular peaks in χ’’(T) are also observed in the Ba-free and M-added samples. On the other hand, in the M-free samples with Ba only one peak is detected. Although samples with Ba and M-compounds introduced separately are showing some improved properties comparative with the un-added samples, for the samples with double addition (Ba and M) most of the superconducting characteristics are suppressed comparative to the best samples with only one addition of Ba or M. Of interest is that for these double added samples (with Ba and M), the tendencies of the superconducting characteristics vs. M-concentration are, in most cases, similar to Ba-free and M-added samples, but some differences were also noted. This result suggests that: (1)- the influence of M-addition is very strong, (2)- double addition might be useful for independent tuning of some properties while maintaining the tendencies of the others, and that (3)- the optimization process should be adjusted for each composition to keep the maximized overall characteristics..

Keywords

Superconductor, BiPbSrCaCuO, Ba, LiF, LiCl, LiI, Ac susceptibility.

Submitted at: Feb. 25, 2008
Accepted at: April 4, 2008

Citation

V. MIHALACHE, GHE.-V. ALDICA, P. BADICA, Addition of Li-based salts into superconducting Bi1.8Pb0.4Sr1.8Ba0.2Ca2Cu3Ox ceramic, Journal of Optoelectronics and Advanced Materials Vol. 10, Iss. 4, pp. 922-925 (2008)