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Ageing phenomena in thin amorphous AsxSe100-x films

M. S. IOVU1,* , I. A. VASILIEV1, O. I. SHPOTYUK2, E. P.COLOMEICO1

Affiliation

  1. Institute of Applied Physics, Academy of Sciences of Moldova, Str. Academiei 5, MD-2028 Chisinau, Republic of Moldova
  2. Scientific Research Company “Carat”, 202 Stryjska str.202, 79031 Lviv, Ukraine

Abstract

The quasi-static capacitance of amorphous As10Se90 thin films was studied in cycles of heating and cooling near the glass transition temperature Tg=343 K. Features in the capacitance behavior such as: non-exponential relaxation, non-Arrhenius character of time relaxations, hysteresis of temperature dependence, physical ageing - are revealed near this temperature. It was accepted, that the capacitance measurements allow finding the glass transition temperature Tg in amorphous As10Se90 thin films which is accompanied by freezing of some electric dipoles; these dipoles are forming from neighboring pairs of charged defects such as D+ and D- ..

Keywords

Chalcogenide glasses, Amorphous films, Capacitance, Glass transition temperature.

Submitted at: July 5, 2009
Accepted at: Dec. 10, 2009

Citation

M. S. IOVU, I. A. VASILIEV, O. I. SHPOTYUK, E. P.COLOMEICO, Ageing phenomena in thin amorphous AsxSe100-x films, Journal of Optoelectronics and Advanced Materials Vol. 11, Iss. 12, pp. 2011-2018 (2009)