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Analysis of conduction mechanism in lamellar double hydroxide by impedance spectroscopy

ABDERRAHMANE ELMELOUKY1, RADDAD EL MOZNINE1, REDOUANE LAHKALE2, RACHID SADIK2, ELMOULOUDI SABBAR2, EL GHAOUTI CHAHID1, ELHASSAN CHOUKRI3, DAOUD MEZZANE3, AIMAD BELBOUKHARI3

Affiliation

  1. Laboratoire de Physique de La Matière Condensées (LPMC). Université Chouaib Doukkali, Faculté des sciences, El-Jadida, Morocco
  2. Laboratoire de Physicochimie des matériaux(LPCM). Université Chouaib Doukkali, Faculté des sciences, El-Jadida, Morocco
  3. Laboratory of the Condensed Matter and Nanostructures LMCN Faculty of Science and Technique FST – Gueliz

Abstract

Zn-Al layered double hydroxides (LDHs) were prepared; using the co-precipitation method; with Cl – and NO3 –interlayer anions and with two Zn ⁄ Al ratio (R=2 and R=3). The structural evolution of these compositions was characterized by Riveted analysis on powder X-ray diffraction diagrams. Impedance measurements of these compositions were investigated in the frequency range [100Hz–1MHz] and in the temperature range 25 °C - 90°C. Cole–Cole plots in impedance spectra showed non-Debye relaxation. The temperature dependence of the relaxation times for all samples showed Arrhenius behavior, from which the activation energy was derived. The real part of ac conductivity spectra of these materials obeys Jonscher power law. The nature of variation of the electrical conductivity, and value of activation energy of different samples, suggest that the conduction process appear clearly related to the structural evolution of the interlayer domain..

Keywords

Lamellar, Hydroxide, LDH, Anionic clay, Protonic conduction, Impedance Spectroscopy, X-ray diffraction.

Submitted at: Sept. 28, 2013
Accepted at: Nov. 7, 2013

Citation

ABDERRAHMANE ELMELOUKY, RADDAD EL MOZNINE, REDOUANE LAHKALE, RACHID SADIK, ELMOULOUDI SABBAR, EL GHAOUTI CHAHID, ELHASSAN CHOUKRI, DAOUD MEZZANE, AIMAD BELBOUKHARI, Analysis of conduction mechanism in lamellar double hydroxide by impedance spectroscopy, Journal of Optoelectronics and Advanced Materials Vol. 15, Iss. 11-12, pp. 1239-1247 (2013)