"

Cookies ussage consent

Our site saves small pieces of text information (cookies) on your device in order to deliver better content and for statistical purposes. You can disable the usage of cookies by changing the settings of your browser. By browsing our site without changing the browser settings you grant us permission to store that information on your device.

I agree, do not show this message again.

Classical holography experiments in digital terms

P. C. LOGOFATU1,* , F. GAROI1, A. SIMA1, B. IONITA2, D. APOSTOL1

Affiliation

  1. Laser Dept., National Institute for Laser, Plasma and Radiation Physics PO Box MG-36, 077125, Magurele, Romania
  2. GSI Helmholtz Centre for Heavy Ion Research GmbH, Planckstrasse 1, D-64291 Darmstadt, Germany

Abstract

In this paper we present some classical holographic experiments only this time performed in various digital experimental arrangements. The information of the hologram is either calculated using discrete light diffraction formulae or recorded on a CCD, which takes the place of the registration holographic plate. The information of the hologram may be coded on a SLM which when illuminated reproduces the effects of the diffraction through the hologram or the diffraction may be calculated by a computer and so the output may be obtained more or less digitally. The distinction between virtual and actual digital is stressed. Experiments starting from the simple playback of computer generated Fourier holograms, going through basic interference experiments such as obtaining fringes of equal inclination up to more sophisticated configurations such as Fresnel holograms, are presented with a stress on the digital aspects that make these experiments depart from their classic counterpart..

Keywords

Digital holography, Classical holography, Information optics, Digital optics.

Submitted at: Dec. 15, 2009
Accepted at: Jan. 20, 2010

Citation

P. C. LOGOFATU, F. GAROI, A. SIMA, B. IONITA, D. APOSTOL, Classical holography experiments in digital terms, Journal of Optoelectronics and Advanced Materials Vol. 12, Iss. 1, pp. 85-93 (2010)