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Y. L. HAO1,* , H. CHEN1, S. Y. WANG2, H. R. MENG3, X. Y. LIU3, M. H. NIU1, J. G. JIANG1, X. C. DENG1, K. J. ZHOU1, G. CHEN4
- College of Information Science & Electronic Engineering, Zhejiang University, Zheda Rd. 38, Hangzhou, China
- Key Laboratory of Infrared System Detection and Imaging Technology,Chinese Academy of Sciences, Shanghai, China
- ChangchunInstitute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, China
- Shenzhen Institute of Zhejiang University, Shenzhen, China
A comparative analysison characteristics of the two phase shifting schemes, length difference scheme (LDS) and refractive index difference scheme(RIDS), is carried out onsilica based phase shifters designed respectively by thetwo schemes. Results show that overthe wavelength range of 1500-1600 nm,phase shifter designed by LDS possesses higher sensitivityto wavelength, and also higher immunity towaveguidefabricationimperfections, in terms of waveguide geometry, and waveguide refractive index as well;by contrast, phase shifter designed by RIDShas a wider working wavelength range, but it suffers from much higher sensitivity to waveguide fabrication imperfections..
Phase shifter, Integrated optics, Wavelength dependence, Fabrication imperfections.
Submitted at: May 28, 2020
Accepted at: Dec. 7, 2020
Y. L. HAO, H. CHEN, S. Y. WANG, H. R. MENG, X. Y. LIU, M. H. NIU, J. G. JIANG, X. C. DENG, K. J. ZHOU, G. CHEN, Comparative analysis on phase shifting schemes in planar lightwave circuit devices, Journal of Optoelectronics and Advanced Materials Vol. 22, Iss. 11-12, pp. 551-557 (2020)
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