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Control system, device and technologies for thin wire diameter measurement

I. AVARVAREI1, O. DONTU1, I. D. FILIPOIU1, D. BESNEA1,* , O. TURCAN1, D. SAVASTRU2

Affiliation

  1. Faculty of Mechanical and Mechatronics Engineering Bucharest, "POLITEHNICA" University of Bucharest, Romania,
  2. National Institute for Research and Development of Optoelectronics, 409 Atomistilor Str., Magurele, Ilfov, Romania

Abstract

This paper presents the results of research regarding designing and manufacturing of a measuring device used to estimate the diameter of thin wires (0.015-1mm). The system uses the diffraction produced by a laser radiation and interprets the diffraction pattern. The designing and manufacturing stage of the measuring device using CNC milling machines as well as the logical scheme, the electronic components and the Lab View program are presented..

Keywords

Laser, Measurement, Diameter, Thin-wire, Diffraction.

Submitted at: July 20, 2011
Accepted at: Aug. 10, 2011

Citation

I. AVARVAREI, O. DONTU, I. D. FILIPOIU, D. BESNEA, O. TURCAN, D. SAVASTRU, Control system, device and technologies for thin wire diameter measurement, Journal of Optoelectronics and Advanced Materials Vol. 13, Iss. 8, pp. 1030-1036 (2011)