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S. OZHARAR1, D. AKCAN2, L. ARDA2,*
- Department of Electrical and Electronics Engineering, Faculty of Engineering and Natural Sciences, Bahçeşehir University, Çırağan Cad. Beşiktaş, 34353 İstanbul Turkey
- Department of Mechatronics Engineering, Faculty of Engineering and Natural Sciences, Bahçeşehir University, Çırağan Cad. Beşiktaş, 34353 İstanbul Turkey
The well-known Swanepoel’s method to calculate the refractive index and the thickness of thin films based on their optical transmission, is only applicable to single facet coated substrates (SFCS), and does not return the correct values when applied to double facet coated substrates (DFCS). In this work, we present a novel model and an analytical method to characterize the thin film coated on both sides of a substrate. In order to confirm the validity of our novel method, we have fabricated two samples; a DFCS and a SFCS with identical thin films. The thin film on SFCS is analyzed using Swanepoel’s method, and the thin films on DFCS are analyzed using our novel method. The refractive index and the thickness value calculated with these two different methods on two different substrates are in agreement with each other and also with the SEM measurements..
Sol-gel, Thin films, Optical transmission, Refractive index, ZnO.
Submitted at: July 27, 2015
Accepted at: Feb. 10, 2016
S. OZHARAR, D. AKCAN, L. ARDA, Determination of the refractive index and the thickness of double side coated thin films, Journal of Optoelectronics and Advanced Materials Vol. 18, Iss. 1-2, pp. 65-69 (2016)
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