"

Cookies ussage consent

Our site saves small pieces of text information (cookies) on your device in order to deliver better content and for statistical purposes. You can disable the usage of cookies by changing the settings of your browser. By browsing our site without changing the browser settings you grant us permission to store that information on your device.

I agree, do not show this message again.

Effect of Cu incorporation on the optical parameters of Se75Te25 thin film

S. SHUKLA1, S. KUMAR1,*

Affiliation

  1. Department of Physics, Christ Church College, Kanpur-208001, India

Abstract

Amorphous thin films of Se75Te25-xCux (x = 0 & 10) have been deposited onto chemically cleaned glass substrate by thermal evaporation technique in the presence of vacuum. The optical parameters like refractive index (n), extinction coefficient (k), absorption coefficient (α), real and imaginary dielectric constants (ε ’ & ε”) have been calculated in the wavelength range 400-2100 nm by Swanepoel method using optical transmission data. It is observed that extinction coefficient (k) and imaginary dielectric constants (ε”) decrease with increase in wavelength (λ). The absorption coefficient (α) increases with photon energy (hν). It is also found that refractive index (n) decreases and extinction coefficient (k), absorption coefficient (α), imaginary dielectric constants (ε”) increases with Cu content. The optical band gap (Eg) has also been calculated by Tauc’s relation and found to decrease with Cu content in Se75Te25-xCux system. The results are interpreted in terms of change in the density of localized states (DOS)..

Keywords

Chalcogenide glasses, Thin films, Optical parameters, DOS.

Submitted at: May 18, 2010
Accepted at: Aug. 12, 2010

Citation

S. SHUKLA, S. KUMAR, Effect of Cu incorporation on the optical parameters of Se75Te25 thin film, Journal of Optoelectronics and Advanced Materials Vol. 12, Iss. 8, pp. 1696-1699 (2010)