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Effect of optical coating in the thin-film system of chalcogenide glassy semiconductor-dielectric when recording the holographic optical information

A. CHIRITA1, V. PRILEPOV1, M. POPESCU2,* , I. ANDRIES1, M. CARAMAN1, IU. JIDCOV1

Affiliation

  1. Moldova State University, 60 A. Mateevici Str., Chisinau, MD-2009, Republic of Moldova
  2. National Institute of Materials Physics, 105 bis Atomistilor Str., P.O. Box MG 7, RO-77125 Măgurele, Romania

Abstract

In this paper we show that the possibility of obtaining the high values of efficiency of relief-phase holographic gratings formed in the photo-thermoplastic recording process holds not only due to the non-sinusoidal profile form, but also due to the effect of optical coating that appears in the two-layer system of photo-semiconductor – deformed thermoplastic. Analyzed are the conditions, under which takes place the antireflection optical coating, reducing unwanted reflections from surfaces and thereby enhancing efficiency. It is shown that by careful choice of the thicknesses and refractive indices of the layers materials the efficiency of holographic gratings can be improved by 2-5 %..

Keywords

Photo-thermoplastic carriers; Holographic gratings; Non-sinusoidal profile; Diffraction efficiency; Impact of optical coating.

Submitted at: June 9, 2015
Accepted at: June 24, 2015

Citation

A. CHIRITA, V. PRILEPOV, M. POPESCU, I. ANDRIES, M. CARAMAN, IU. JIDCOV, Effect of optical coating in the thin-film system of chalcogenide glassy semiconductor-dielectric when recording the holographic optical information, Journal of Optoelectronics and Advanced Materials Vol. 17, Iss. 7-8, pp. 925-929 (2015)