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S. S. CHIAD1, N. F. HABUBI1,* , W. H. ABASS2, M. H. ABDUL-ALLAH3
- Al_Mustansiriyah University, College of Education, Physics Department, Baghdad- Iraq
- AL- Mustansyriah University, College of Basic Education , Science Department,Baghdad- Iraq
- University of Diyala, College of Science, Physics Department,Diyala- Iraq
Cd0.4Se0.6 thin films have been prepared by chemical bath deposition technique.AFM images confirm the appearance of nanostructure. The optical constants represented by absorbance, reflectance, extinction coefficient , refractive index, real and imaginary parts of dielectric constant were studied as a function of thickness variation .It was found that all these constants were affected by thickness. Dispersion relation was applied in order to show the effect of thickness on these parameters which were discussed in details through this work..
Nanostructure, Cadmium compound, Inorganic compound, Semiconducting II-VI material.
Submitted at: Oct. 23, 2015
Accepted at: Sept. 29, 2016
S. S. CHIAD, N. F. HABUBI, W. H. ABASS, M. H. ABDUL-ALLAH, Effect of thickness on the optical and dispersion parameters of Cd0.4Se0.6 thin films, Journal of Optoelectronics and Advanced Materials Vol. 18, Iss. 9-10, pp. 822-826 (2016)
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