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Elucidating the dielectric properties of La(Mg0.5Sn0.5-xTix)O3 ceramics at microwave frequencies

Y.-C. CHEN1,* , K.-C. CHEN1, K.-C. CHANG1, C.-L. CHEN1

Affiliation

  1. Department of Electrical Engineering, Lunghwa University of Science and Technology, Gueishan Shiang, Taoyuan County, Taiwan

Abstract

The microwave dielectric properties of La(Mg0.5Sn0.5-xTix)O3 ceramics were examined with a view to their exploitation for mobile communication. The La(Mg0.5Sn0.5-xTix)O3 ceramics were prepared by the conventional solid-state method with various sintering temperatures. The X-ray diffraction patterns of the La(Mg0.5Sn0.45Ti0.05)O3 ceramics revealed no significant variation of phase with sintering temperatures. The La2Sn2O7 intensity of the second phase of the La(Mg0.5Sn0.5-xTix)O3 ceramics was lowest when x was 0.05. An apparent density of 6.53 g/cm3 , a dielectric constant ( r ε ) of 20.8, a quality factor (Q × f) of 50,100 GHz, and a temperature coefficient of resonant frequency ( f τ ) of -71 ppm/OC were obtained for La(Mg0.5Sn0.45Ti0.05)O3 ceramics that were sintered at 1550 OC for 4 h..

Keywords

La(Mg0.5Sn0.5-xTix)O3, X-ray diffraction pattern, Dielectric constant, Quality factor, Temperature coefficient of resonant frequency.

Submitted at: Sept. 19, 2010
Accepted at: Nov. 19, 2010

Citation

Y.-C. CHEN, K.-C. CHEN, K.-C. CHANG, C.-L. CHEN, Elucidating the dielectric properties of La(Mg0.5Sn0.5-xTix)O3 ceramics at microwave frequencies, Journal of Optoelectronics and Advanced Materials Vol. 12, Iss. 11, pp. 2214-2220 (2010)