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M. J. ESHRAGHI1,*
- Semiconductors Dep., Materials and Energy Research Center, Meshkin Dasht, IRAN
CdTe thin films with 2.8 µm thickness were deposited by electron beam evaporation method. X-ray diffraction, scanning electron microscopy, UV-Vis-NIR spectroscopy and atomic force microscopy (AFM) were used to characterize the films. The results of AFM analysis revealed that the CdTe films have uniform surface. CdTe thin films were heat-treated by SnCl2 solution. Structural analysis using XRD showed that heat treatment by SnCl2 solution improves thin film crystallinity. A solar cell device was fabricated based on electron beam deposited poly-crystalline CdTe and CdS thin film as absorber and window layer on ITO coated soda lime glass as substrate. The electrical characteristics of CdS/CdTe thin film solar cells were investigated under illumination. From the current-voltage characteristics of fabricated device a typical rectifying photovoltaic behavior was obtained..
CdTe, Absorber Layer, Thin Film, Solar Cell, Electron Beam Evaporation.
Submitted at: Oct. 16, 2015
Accepted at: Aug. 9, 2017
M. J. ESHRAGHI, Enhanced physical properties of e-beam evaporated CdTe thin films for photovoltaic application, Journal of Optoelectronics and Advanced Materials Vol. 19, Iss. 7-8, pp. 501-505 (2017)
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