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Fast phase retrieval by temporal phase shifting and double-digital fringe projection

DAVID ASAEL GUTIÉRREZ HERNÁNDEZ1,* , J. R. PARRA MICHEL1, G. ATONDO-RUBIO2, ALEJANDRO TÉLLEZ-QUIÑONES3, JOSUE DEL VALLE HERNÁNDEZ4

Affiliation

  1. Escuela de Ingenierías. Universidad De La Salle Bajío, Av. Universidad 602, Col. Lomas del Campestre, León, Guanajuato, México
  2. Escuela de Ciencias Físico–Matemáticas, Universidad Autónoma de Sinaloa, Ciudad Universitaria s/n, C.P. 80010 Culiacán, Sinaloa, México
  3. Centro de Investigación en Geografía y Geomática “Ing. Jorge L. Tamayo”, A.C., Contoy 137. Col. Lomas de Padierna, C.P. 14240 Tlalpan-Ciudad de México D.F., México
  4. Tecnológico Nacional de México. Instituto Tecnológico de León. División de Estudios de Posgrado e Investigación. Avenida Tecnológico s/n, Industrial Julián de Obregón, C.P. 37290 León, Guanajuato, M

Abstract

This paper presents the application of a five-step temporal phase shifting technique for recovering the phase map from fringe patterns. The fringe patterns come from a double-digital fringe projection along the object under study allowing, inclusive, the measurement of the extremes of the object, where with other techniques it is impossible due to shadows generated for the angle of projection. Experiments demonstrate that the combination of these techniques is very simple and easy to implement for engineering purposes. A few experiments are presented and the surface profiles of different objects are shown..

Keywords

Phase Retrieval, Digital Fringe Projection, Profilometry.

Submitted at: May 31, 2016
Accepted at: Sept. 29, 2016

Citation

DAVID ASAEL GUTIÉRREZ HERNÁNDEZ, J. R. PARRA MICHEL, G. ATONDO-RUBIO, ALEJANDRO TÉLLEZ-QUIÑONES, JOSUE DEL VALLE HERNÁNDEZ, Fast phase retrieval by temporal phase shifting and double-digital fringe projection, Journal of Optoelectronics and Advanced Materials Vol. 18, Iss. 9-10, pp. 750-756 (2016)