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S. MICAN1,* , D. BENEA1, A. TAKÁCS1, E. MOSSANG2,3, O. ISNARD2,3, V. POP1
- Babeş-Bolyai University, Faculty of Physics, 1 M. Kogălniceanu, 400084, Cluj-Napoca, Romania
- Université Grenoble Alpes, Institut Néel, 25 Rue des Martyrs, F-38042, Grenoble, France
- CNRS, Institut Néel, 25 Rue des Martyrs, F-38042, Grenoble, France
The influence of Fe1-xCox thickness on the magnetic properties of Cr/Fe1-xCox bilayers is investigated. Electronic structure calculations showed that the Cr moments are suppressed by Co addition and by the deposition of multiple Fe1-xCox layers. Cr/Fe65Co35 bilayers were studied experimentally. Structural investigations showed the presence of strain and a rough Cr/Fe65Co35 interface in the measured samples. The magnetic data was analyzed using the Mauri-Siegmann model, which showed that the interfacial Cr moments decrease with increasing Fe65Co35 thickness. A large bias field of 0.09T was found at 4K for the sample with a 10 nm thick Fe65Co35 layer, around 10 times larger than previous reports..
Thin films, Cr/Fe-Co bilayers, Band structure calculations, Magnetic measurements, Exchange bias.
Submitted at: Aug. 25, 2018
Accepted at: June 14, 2019
S. MICAN, D. BENEA, A. TAKÁCS, E. MOSSANG, O. ISNARD, V. POP, Influence of ferromagnetic layer thickness on the magnetic properties of Cr/Fe1-xCox bilayers, Journal of Optoelectronics and Advanced Materials Vol. 21, Iss. 5-6, pp. 407-417 (2019)
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