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Investigation of electrical and dielectric properties of Ge20Se80-xTex glasses doped by Er, Ho, Pr

J. KALUŽNÝ1,* , J. PEDLÍKOVÁ2, P. KOSTKA2, V. LABAŠ1, M. KUBLIHA1, J. ZAVADIL3, S. MINÁRIK1

Affiliation

  1. Department of Physics, Institute of Materials Science , Faculty of Material Science and Technology of the Slovak University of Technology, Paulínska 16, 917 24 Trnava, Slovakia
  2. Laboratory of Inorganic Materials, Institute of Inorganic Chemistry, Academy of Sciences of the Czech Republic, 250 68 Řeř u Prahy, The Czech Republic,
  3. Department of Diagnostics, Institute of Photonics and Electronics, Academy of Sciences of the Czech Republic, Chaberská 57, 182 51 Prague, The Czech Republic.

Abstract

There were measured temperature dependencies of direct electrical conductivity, temperature and frequency dependencies of complex permitivity and complex electrical modulus (M* = 1/ ε *) as well, for glasses Ge20Se80-xTex (where x is 0, 5, 10 and 15) doped by Pr3+, Er 3+, Ho3+ (1 000 wt. ppm). The admixture of rare earth was added in the form of oxide or the pure metal. The measured results confirm that searched glasses own only one mechanism of electrical conductivity where activation energy is affected by Te concentration. This parameter affects the increase of the values of conductivity, too. Results of measurements of complex electrical modulus showed, that the measured glasses are otherwise characterized as mono-phase but non-homogeneous with the high concentration of the point defects and they are stable up to temperature of 180 °C. The influence of chemical composition, non-stechiometry, as well, is usually only low. The admixtures are inbuilt to the glass skeleton as atoms with the saturated bonds. Considering the reached results it is possible to say that the reached quality of glasses with respect to the amount of defects is probably given mainly by the concentration of the rare earth..

Keywords

Chalcogenide glasses, Doped Ge-Se-Te, Pf, Er, Ho, Electrical and dielectric properties.

Submitted at: July 5, 2009
Accepted at: Dec. 10, 2009

Citation

J. KALUŽNÝ, J. PEDLÍKOVÁ, P. KOSTKA, V. LABAŠ, M. KUBLIHA, J. ZAVADIL, S. MINÁRIK, Investigation of electrical and dielectric properties of Ge20Se80-xTex glasses doped by Er, Ho, Pr, Journal of Optoelectronics and Advanced Materials Vol. 11, Iss. 12, pp. 2063-2068 (2009)