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Investigation on the growth and characterization of sulphuric acid and nitric acid doped thiourea single crystals

S. SURENTHERABABU1,* , P. RAJASEKARAN2

Affiliation

  1. Department of Physics, Park college of Engineering and Technology, Coimbatore-641659, India
  2. bDepartment of Physics, Nightingale Institute of Technology, Coimbatore-641105, India

Abstract

Sulphuric acid and nitric acid doped thiourea single crystals were grown by solvent evaporation technique. Four distinct morphologies of thiourea crystals were observed in the growth cells. The structures of the crystals are identified as orthorhombic by single crystal X-ray diffraction technique. The spectral bands and optical transmission spectrum of the grown crystals have been compared with similar thiourea complexes using FTIR spectrum in the range 400 – 4000 cm-1 and UV-Vis spectrometer respectively. The mechanical hardness is performed on the grown crystals by Vicker’s microhardness study and the results reveal that the crystals are mechanically moderately soft. The stiffness constant indicates that the binding forces between the ions are quite strong..

Keywords

Solution growth, Single crystal XRD, FTIR, UV-Vis, Microhardness, Stiffness constant.

Submitted at: Oct. 5, 2013
Accepted at: July 10, 2014

Citation

S. SURENTHERABABU, P. RAJASEKARAN, Investigation on the growth and characterization of sulphuric acid and nitric acid doped thiourea single crystals, Journal of Optoelectronics and Advanced Materials Vol. 16, Iss. 7-8, pp. 898-902 (2014)