Cookies ussage consent
Our site saves small pieces of text information (cookies) on your device in order to deliver better content and for statistical purposes. You can disable the usage of cookies by changing the settings of your browser. By browsing our site without changing the browser settings you grant us permission to store that information on your device.I agree, do not show this message again.
G. XU1, J. Y. LI1, R. H. NAN1, W. L. ZHOU1, Z. GU2, L. ZHANG2, X. M. MA3, X. P. CAO3
- School of Materials and Chemical Engineering, Xi’an Technological University, Xi’an 710032, P.R.China;
- State Key Laboratory of Solidification Processing, North western Polytechnical University, Xi’an, 710072, P.R.China;
- Nuctech Company Limited, Beijing, 100084, P.R.China
1 cm2 and 36 cm2 area of HgI2 polycrystalline films were grown by physical vapor deposition (PVD), respectively. The properties of films with areas of 1 cm2 were investigated by XRD, SEM and J-V analysis as prior period research. The results of XRD show that the ratio of (001) / (hkl) is amount to be 90%. Grain size of films grown was measured to be 120-150 µm, and their electrical resistivity were also determined as about 1011 Ω·cm operated at the bias voltage of ~100 V by I-V characteristic measurement. Larger one with 36 cm2 areas was then deposited on TFT after craft optimization. The oriented of films were also measured by XRD, which show that the oriented of grains decrease with area. Image prepared after capsulation was tested for non-corrosive nut imaging. X-ray imager was made of 36 cm2 HgI2 polycrystalline films. A256×256 pixels X-ray image of a non-corrosive nut was obtained under 80KeV with 6mA. The outer hexagon and the inner circular shape of the nut are distinct, which shows that the films meet the need of dental X-ray unit..
Mercuric iodide, polycrystalline, X-ray imaging.
Submitted at: July 30, 2015
Accepted at: Sept. 29, 2016
G. XU, J. Y. LI, R. H. NAN, W. L. ZHOU, Z. GU, L. ZHANG, X. M. MA, X. P. CAO, Large area HgI2 polycrystalline films for X-Ray imager, Journal of Optoelectronics and Advanced Materials Vol. 18, Iss. 9-10, pp. 842-846 (2016)
- Download Fulltext
- Downloads: 99 (from 45 distinct Internet Addresses ).