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Low temperature X-Ray powder diffraction study of lead telluride doped with Yb

A. NICORICI1, V. SHKLOVER2, A. TODOSICIUC1,*

Affiliation

  1. Institute of Electronic Engineering and Industrial Technologies, ASM Kishinev, Academiei str. 3/1, 2028, Moldova
  2. Laboratory of Crystallography, ETH-Zurich, Wolfgang-Pauli-Strasse 10, 8093 Zurich, Switzerland

Abstract

The temperature and doping range dependences of the lattice constant of PbTe:Yb samples were studied. The concentration of the doping element CYb has varied between 0.5 and 2 at%. The temperature dependences of the lattice constant a of the cubic unit cell of the PbTe:Yb samples from room temperature down to 100 K were measured on a Scintag powder diffractometer equipped with He cryostat. It was shown that at room temperature the lattice constants of PbTe:Yb samples decrease approximately linearly with increasing the Yb content from a=6.4621(0)Å for CYb=0 to a=6.4591(3)Å for CYb=2,0. The lattice constants decrease linearly with decreasing of the temperature, the ∂a/dT values are 0.000135 Å/K for PbTe and 0.000125 Å/K for PbTe:Yb<1.5%>. The accuracy of these measurements was better than 0.02%. The thermal expansion coefficient α of PbTe:Yb<2%> was measured in the temperature range from 300 to 80 K, using Netzch dilatometer. The experimental results showed that the thermal expansion coefficient α of PbTe:Yb<1%> remains constant in the studied temperature range from 300 to 80 K, and its value is α=19.73 ·10-6 K-1..

Keywords

Lattice constant, Lead telluride, X-ray diffraction, Linear thermal expansion coefficient.

Submitted at: Feb. 25, 2008
Accepted at: April 4, 2008

Citation

A. NICORICI, V. SHKLOVER, A. TODOSICIUC, Low temperature X-Ray powder diffraction study of lead telluride doped with Yb, Journal of Optoelectronics and Advanced Materials Vol. 10, Iss. 4, pp. 860-861 (2008)