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Morphology, structural and optical study of ZnS thin films prepared by Successive Ionic Layer Adsorption and Reaction (SILAR) Method

A. DJELLOUL1,* , M. ADNANE1, Y. LARBAH1, S. HAMZAOUI1

Affiliation

  1. Laboratory of Electron Microscopy and Materials Sciences, University of Science and Technology of Oran, BP 1505, El-Mnaouer Oran, 31000, Algeria

Abstract

Zinc Sulphide (ZnS) thin films are deposited on glass substrate by relatively simple, quick and cost effective successive ionic layer adsorption and reaction (SILAR) method at room temperature (27°C). For ZnS thin film growth the parameters including concentrations of cationic and ionic precursors, number of immersion cycle, immersion time and pH of the solution are optimized. A further study has been made for structural, surface morphological and optical properties of the film using Xray diffraction (XRD), EDAX, scanning electron microscopy (SEM), and optical absorption method (UV). The as deposited ZnS thin film exhibited hexagonal phase with optical band gap (Eg) of 3.93 eV. SEM image confirmed that film of smooth surface morphology..

Keywords

ZnS, SILAR, XRD, EDAX, SEM, UV.

Submitted at: March 4, 2015
Accepted at: Feb. 10, 2016

Citation

A. DJELLOUL, M. ADNANE, Y. LARBAH, S. HAMZAOUI, Morphology, structural and optical study of ZnS thin films prepared by Successive Ionic Layer Adsorption and Reaction (SILAR) Method, Journal of Optoelectronics and Advanced Materials Vol. 18, Iss. 1-2, pp. 136-141 (2016)