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R. SANTIAGO-MONTERO1, D. A. GUTIÉRREZ-HERNÁNDEZ1,* , D. A. OLIVARES-VERA1, V. ZAMUDIO1
- Tecnológico Nacional de México. Instituto Tecnológico de León. División de Estudios de Posgrado e Investigación, Avenida Tecnológico s/n, Industrial Julián de Obregón, C.P. 37290 León, Guanajuato, Mé
Nowadays, a goodness digital compactness measure is necessary in computer vision, shape analysis and computer medical diagnosis process where digital picture are used widely. We introduce a compactness measure called Normalized E-Factor which shows as a measure robust to translations, rotations and scale-changes and that it satisfies the set of criteria for a good compactness measure. Through a series of experiments, we show that the Normalized E-Factor is useful for shape description, measuring digital compactness with or without holes and that it overcomes some drawbacks that present several compactness measures over digital space..
Shape description, Shape classification, Compactness measure, Digital region descriptor, Normalized.
Submitted at: Jan. 12, 2021
Accepted at: Aug. 16, 2021
R. SANTIAGO-MONTERO, D. A. GUTIÉRREZ-HERNÁNDEZ, D. A. OLIVARES-VERA, V. ZAMUDIO, Normalized E-factor. A digital region descriptor for 2D and 3D space shape classification, Journal of Optoelectronics and Advanced Materials Vol. 23, Iss. 7-8, pp. 331-338 (2021)
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