"

Cookies ussage consent

Our site saves small pieces of text information (cookies) on your device in order to deliver better content and for statistical purposes. You can disable the usage of cookies by changing the settings of your browser. By browsing our site without changing the browser settings you grant us permission to store that information on your device.

I agree, do not show this message again.

Optical and microstructural properties of pure and Ru doped SnO2 semiconducting thin films

O. MERMER1,* , H. SOZBILEN1

Affiliation

  1. Ege University, Department of Electrical and Electronic Engineering, Bornova, 35100 Izmir TURKEY

Abstract

Pure and ruthenium (Ru) doped nanostructure SnO2 (Ru-SnO2) semiconductor films were prepared by sol-gel technique on glass substrates. The effect of Ru incorporation on microstructure and optical properties of SnO2 films was investigated. Crystalline structure, orientations, morphological, optical properties of the films were investigated by using XRD, SEM, AFM, VEECO profilometer, and UV spectrophotometer, respectively. The optical band gap, refractive index, extinction coefficient and dielectric constants were calculated by using transmittance and reflectance spectrum of the films. The obtained structural data indicated that all the films possess polycrystalline structure with tetragonal rutile SnO2 and Ru incorporation conducts to significant changes in the microstructure of the SnO2 films. In addition to these, the highest average optical transmittance value was obtained in the visible region for pure SnO2 film. It was found that optical band gap of film was decreased with the increase in Ru doping, and absorption edge shifted to higher wavelengths with incorporation of Ru..

Keywords

Ru doped SnO2, Sol-gel, Microstructural properties, Optical bandgap.

Submitted at: June 25, 2014
Accepted at: Nov. 13, 2014

Citation

O. MERMER, H. SOZBILEN, Optical and microstructural properties of pure and Ru doped SnO2 semiconducting thin films, Journal of Optoelectronics and Advanced Materials Vol. 16, Iss. 11-12, pp. 1306-1310 (2014)