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Optical and structural study of BST multilayers

V. ŽELEZNÝ1,* , D. CHVOSTOVÁ1, L. PAJASOVÁ1, M. JELÍNEK1, T. KOCOUREK1, S. DANIŠ2, V. VALVODA2

Affiliation

  1. Institute of Physics, Academy of Sciences of the Czech Republic, Na Slovance 2, 182 21 Prague 8, Czech Republic
  2. Charles University, Faculty of Mathematics and Physics, Department of Condensed Matter Physics, Ke Karlovu 5, 121 16 Prague 2, Czech Republic

Abstract

Ba0.75Sr0.25TiO3/SrTiO3 multilayers were grown by plasma laser deposition on platinized silicon. Their total thickness was about 300 nm and they consisted of 20 double layers each of thickness 8 nm. X-ray diffraction was used for the characterization of sample microstucture, and surface profiler (alpha step) to determine the film thickness and surface roughness. Optical properties of the multilayers were investigated using spectroscopic ellipsometry and normal-incident reflectivity in the spectral range (1 - 14 eV) at room temperature and their temperature dependence using ellipsometry. The optical parameters of the Pt-coated substrates were fitted using the Drude model and then kept fixed in the subsequent calculation. In the transparent range the spectra were modeled by the Cauchy and Urbach formulas. Direct fit procedure and several models were applied to evaluate optical constants and film thickness. The ellipsometric and reflectivity data were combined to calculate the optical constants and absorption edge..

Keywords

Ellipsometry, Structure, Ferroelectric Multilayers.

Submitted at: June 21, 2009
Accepted at: Feb. 27, 2010

Citation

V. ŽELEZNÝ, D. CHVOSTOVÁ, L. PAJASOVÁ, M. JELÍNEK, T. KOCOUREK, S. DANIŠ, V. VALVODA, Optical and structural study of BST multilayers, Journal of Optoelectronics and Advanced Materials Vol. 12, Iss. 3, pp. 538-541 (2010)