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Optical studies of Se-Te-Bi chalcogenide thin films

N. SURI1,* , P. K. KHANNA1, R. THANGARAJ2

Affiliation

  1. Hybrid Microcircuit Group, Central Electronics Engineering Research Institute (CEERI)/ Council of Scientific and Industrial Research (CSIR), Pilani-333031 (Rajasthan) India
  2. Semiconductors Laboratory, Department of Applied Physics, Guru Nanak Dev University, Amritsar, Punjab-143005, India

Abstract

The reflectance and transmission have been performed for Se80-xTe20Bix (0≤x≤8) thin films. The theory of the reflectance of light from a thin film can be expressed in terms of Fresenl’s coefficient. EPMA studies have been performed on the samples..

Keywords

Amorphous Chalcogenides, Thin films, Optical properties.

Submitted at: April 18, 2009
Accepted at: June 28, 2009

Citation

N. SURI, P. K. KHANNA, R. THANGARAJ, Optical studies of Se-Te-Bi chalcogenide thin films, Journal of Optoelectronics and Advanced Materials Vol. 11, Iss. 6, pp. 794-796 (2009)